MLG1005S3N9ST000 >
MLG1005S3N9ST000
TDK Corporation
FIXED IND 3.9NH 700MA 200MOHM SM
225414 Pcs New Original In Stock
3.9 nH Unshielded Multilayer Inductor 700 mA 200mOhm Max 0402 (1005 Metric)
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MLG1005S3N9ST000 TDK Corporation
5.0 / 5.0 - (131 Ratings)

MLG1005S3N9ST000

Product Overview

6650101

DiGi Electronics Part Number

MLG1005S3N9ST000-DG

Manufacturer

TDK Corporation
MLG1005S3N9ST000

Description

FIXED IND 3.9NH 700MA 200MOHM SM

Inventory

225414 Pcs New Original In Stock
3.9 nH Unshielded Multilayer Inductor 700 mA 200mOhm Max 0402 (1005 Metric)
Quantity
Minimum 1

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In Stock (All prices are in USD)
  • QTY Target Price Total Price
  • 100 0.0075 0.7500
  • 1000 0.0059 5.9000
  • 3000 0.0050 15.0000
  • 10000 0.0046 46.0000
  • 50000 0.0041 205.0000
  • 100000 0.0038 380.0000
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MLG1005S3N9ST000 Technical Specifications

Category Fixed Inductors

Manufacturer TDK

Packaging Tape & Reel (TR)

Series MLG

Product Status Active

Type Multilayer

Material - Core Ceramic, Non-Magnetic

Inductance 3.9 nH

Tolerance ±0.3nH

Current Rating (Amps) 700 mA

Current - Saturation (Isat) -

Shielding Unshielded

DC Resistance (DCR) 200mOhm Max

Q @ Freq 8 @ 100MHz

Frequency - Self Resonant 5GHz

Ratings -

Operating Temperature -55°C ~ 125°C

Inductance Frequency - Test 100 MHz

Mounting Type Surface Mount

Package / Case 0402 (1005 Metric)

Supplier Device Package 0402 (1005 Metric)

Size / Dimension 0.039" L x 0.020" W (1.00mm x 0.50mm)

Height - Seated (Max) 0.022" (0.55mm)

Datasheet & Documents

HTML Datasheet

MLG1005S3N9ST000-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 1 (Unlimited)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8504.50.8000

Additional Information

Other Names
445-3049-1
445-3049-2
MLG1005S3N9S
MLG1005S3N9ST
445-3049-6
Standard Package
10,000

Alternative Parts

PART NUMBER
MANUFACTURER
QUANTITY AVAILABLE
DiGi PART NUMBER
UNIT PRICE
SUBSTITUTE TYPE
MLK1005S3N9ST000
TDK Corporation
35357
MLK1005S3N9ST000-DG
0.0038
MFR Recommended
ELJ-QF3N9DF
Panasonic Electronic Components
1045
ELJ-QF3N9DF-DG
0.0038
Direct
ELJ-RF3N9DFB
Panasonic Electronic Components
843
ELJ-RF3N9DFB-DG
0.0038
Direct

Reviews

5.0/5.0-(Show up to 5 Ratings)
Fla***Vive
грудня 02, 2025
5.0
Les conseillers chez DiGi Electronics sont incroyablement professionnels et aimables.
Lic***eele
грудня 02, 2025
5.0
Sehr benutzerfreundlich gestaltet, erleichtert mir die tägliche Arbeit erheblich.
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грудня 02, 2025
5.0
The reliability of DiGi Electronics’ equipment has significantly reduced our maintenance costs.
Wild***rted
грудня 02, 2025
5.0
They have an excellent track record of delivering on time, which is crucial for my development projects.
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грудня 02, 2025
5.0
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Whispe***gWinds
грудня 02, 2025
5.0
I appreciate their proactive communication and prompt delivery services.
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грудня 02, 2025
5.0
Their commitment to quality is evident in every aspect of their products.
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Frequently Asked Questions (FAQ)

Can the MLG1005S3N9ST000 replace a shielded inductor like the Murata LQW15AN3N9D00D in a high-density RF front-end design, and what are the risks of using an unshielded part in close proximity to sensitive analog traces?

The MLG1005S3N9ST000 is an unshielded multilayer ceramic inductor, so direct replacement of a shielded wire-wound inductor like the Murata LQW15AN3N9D00D introduces EMI and crosstalk risks. While both offer 3.9 nH inductance, the unshielded construction of the MLG1005S3N9ST000 can radiate magnetic fields, potentially coupling noise into adjacent high-impedance nodes or receive paths in RF circuits. If space constraints prevent adequate spacing (>3× component height), consider adding a grounded guard trace or localized shielding. For designs with tight layout and low noise margins, a shielded alternative such as TDK’s own MHQ1005P series may be safer despite larger footprint.

How does the absence of a specified saturation current (Isat) on the MLG1005S3N9ST000 affect reliability in a 5G mmWave power amplifier bias network operating near 700 mA peak current?

The MLG1005S3N9ST000 does not specify a saturation current because it uses a non-magnetic ceramic core, which inherently avoids magnetic saturation—unlike ferrite-based inductors. However, the 700 mA current rating refers to thermal limits (I_RMS), not magnetic performance. In a 5G mmWave PA bias tee, transient current spikes or duty-cycle variations could push RMS current beyond safe levels, causing localized heating and potential resistance drift. To mitigate risk, validate actual RMS current under worst-case modulation (e.g., 64-QAM or OFDM peaks) and ensure PCB copper area under the 0402 package provides adequate thermal dissipation. Monitor for inductance shift during thermal cycling, as ceramic materials can exhibit microcracking under repeated stress.

Is the MLG1005S3N9ST000 suitable for use in a 28 GHz phased-array antenna matching network where Q factor and parasitic stability are critical, given its Q of only 8 @ 100 MHz?

While the MLG1005S3N9ST000 has a low Q of 8 at 100 MHz, its performance at 28 GHz is dominated by parasitic capacitance and self-resonant behavior rather than core losses. With a self-resonant frequency of 5 GHz, the part operates well beyond resonance at 28 GHz, effectively behaving as a capacitor—making it unsuitable for resonant matching at that frequency. For mmWave applications, consider air-core or thin-film inductors with SRF > 30 GHz, such as Coilcraft’s 0201CS series. If used below 2 GHz (e.g., for DC biasing), the MLG1005S3N9ST000 is acceptable, but never in the signal path above its SRF without full S-parameter validation.

What are the long-term reliability concerns when using the MLG1005S3N9ST000 in automotive under-hood applications exposed to temperature cycling from -40°C to +125°C, despite its rated -55°C to +125°C range?

Although the MLG1005S3N9ST000 is rated for -55°C to +125°C, automotive under-hood environments involve rapid thermal cycling and mechanical stress that can fatigue the brittle ceramic multilayer structure. Repeated expansion/contraction between the inductor and PCB (CTE mismatch) may lead to microcracks, increasing DCR or causing open circuits over time. To enhance reliability, use conformal coating to reduce moisture ingress and mechanical strain, and avoid placing the component near high-stress areas like board edges or mounting holes. Additionally, conduct HAST (Highly Accelerated Stress Test) or thermal cycle testing (-40°C ↔ +125°C, 1000 cycles) during qualification to validate field durability, especially if replacing a more robust wire-wound or molded inductor.

Can I substitute the MLG1005S3N9ST000 with the Samsung CL05A3N9KA5NNNC in a Bluetooth Low Energy (BLE) matching network, and what layout considerations are critical due to differences in construction and parasitics?

The Samsung CL05A3N9KA5NNNC is a comparable 3.9 nH ±0.1 nH multilayer inductor in 0402 packaging, but it has a lower DCR (150 mΩ typical vs. 200 mΩ max for MLG1005S3N9ST000) and potentially different parasitic capacitance due to internal electrode geometry. While electrically similar at BLE frequencies (2.4 GHz), the substitution requires validation of impedance match and insertion loss using network analyzer measurements or EM simulation. Critical layout considerations include maintaining identical pad geometry, minimizing trace stubs, and ensuring symmetrical grounding to preserve Q and SRF behavior. Avoid mixing vendors in production unless both parts are qualified under the same RF load conditions, as subtle parasitic differences can detune matching networks and reduce radiated efficiency.

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