CY7C2663KV18-450BZI >
CY7C2663KV18-450BZI
Infineon Technologies
IC SRAM 144MBIT PAR 165FBGA
22300 Pcs New Original In Stock
SRAM - Synchronous, QDR II+ Memory IC 144Mbit Parallel 450 MHz 165-FBGA (15x17)
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CY7C2663KV18-450BZI Infineon Technologies
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CY7C2663KV18-450BZI

Product Overview

6326587

DiGi Electronics Part Number

CY7C2663KV18-450BZI-DG
CY7C2663KV18-450BZI

Description

IC SRAM 144MBIT PAR 165FBGA

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22300 Pcs New Original In Stock
SRAM - Synchronous, QDR II+ Memory IC 144Mbit Parallel 450 MHz 165-FBGA (15x17)
Memory
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CY7C2663KV18-450BZI Technical Specifications

Category Memory, Memory

Manufacturer Infineon Technologies

Packaging Tray

Series -

Product Status Active

DiGi-Electronics Programmable Not Verified

Memory Type Volatile

Memory Format SRAM

Technology SRAM - Synchronous, QDR II+

Memory Size 144Mbit

Memory Organization 8M x 18

Memory Interface Parallel

Clock Frequency 450 MHz

Write Cycle Time - Word, Page -

Voltage - Supply 1.7V ~ 1.9V

Operating Temperature -40°C ~ 85°C (TA)

Mounting Type Surface Mount

Package / Case 165-LBGA

Supplier Device Package 165-FBGA (15x17)

Base Product Number CY7C2663

Datasheet & Documents

Environmental & Export Classification

RoHS Status RoHS non-compliant
Moisture Sensitivity Level (MSL) 3 (168 Hours)
REACH Status REACH Unaffected
ECCN 3A991B2A
HTSUS 8542.32.0041

Additional Information

Other Names
SP005651511
2832-CY7C2663KV18-450BZI
CY7C2663KV18450BZI
-CY7C2663KV18-450BZI
2015-CY7C2663KV18-450BZI
Standard Package
105

Understanding the CY7C2663KV18-450BZI: High-Bandwidth QDR II+ SRAM for Demanding Applications

Product overview: CY7C2663KV18-450BZI and QDR II+ architecture

The CY7C2663KV18-450BZI static RAM epitomizes high-density memory engineered for bandwidth-intensive environments. Configured as 8M × 18 bits for a total capacity of 144 Mb, this device leverages the QDR II+ (Quad Data Rate II Plus) architecture. At the heart of its design is the dual-port mechanism—independently clocked read and write ports. This separation enables concurrent read and write operations, fully eliminating bus turn-around delays that typically constrain traditional single-port SRAM systems. Such architectural choices directly address performance bottlenecks in modern network switches, routers, and high-performance computing, where data throughput and deterministic latency govern overall system reliability.

The internal timing pipelines of QDR II+ are highly optimized, supporting bus speeds up to 450 MHz in the CY7C2663KV18-450BZI. Synchronous operation, governed by source-synchronous data strobing, contributes to tight timing margins, maintaining data integrity across high-speed interfaces. The architecture’s four-word burst capability further enhances sustained bandwidth, reducing the need for frequent address updates and allowing efficient memory controller design. In such a topology, read data emerges with fixed latency—an essential attribute for applications with stringent Quality of Service (QoS) requirements, such as carrier-grade routers or real-time signal processing.

From a systems integration perspective, the absence of bus-turnaround cycles unlocks full throughput potential. Typical memory subsystems constrained by half-duplex access cycles are surpassed by QDR II+’s ability to simultaneously address line-rate ingress and egress queues. Practical validation often reveals deterministic transaction times even under heavy, randomized traffic loads, making the device suitable for deep-packet inspection engines and buffer-centric compute accelerators. The silicon’s advanced process node and careful signal integrity management minimize core currents under peak demand while maintaining competitive drive strength on all differential data lines.

In deployment, several features require careful tuning for optimal performance. Impedance-matched signal traces, proper termination practices, and the use of offset-calibrated clocks contribute to achieving the datasheet’s maximum data rates in dense PCB layouts. Observations in field deployments indicate improved packet processing per watt when using QDR II+ SRAM, directly attributable to the parallel access and their elimination of temporal bus contention.

A nuanced insight emerges when integrating QDR II+ SRAM in pipeline-oriented ASICs or FPGAs. The de-coupling of reads and writes not only increases transaction rates but aligns naturally with multi-threaded memory access patterns, enabling scalable context switching and arbitration in latency-sensitive environments. Unlike alternatives that rely on bank interleaving or time-multiplexed access, QDR II+’s true dual-port nature yields a simpler logic interface, reduced arbitration complexity, and predictable real-time behavior even as bandwidth scales.

The CY7C2663KV18-450BZI demonstrates the intrinsic advantage of architecturally separating read and write data paths in high-throughput memory systems. Its relevance extends beyond raw bandwidth: architectural determinism, ease of controller integration, and the ability to sustain non-blocking operation under diverse workloads underscore its value in next-generation communication and compute infrastructure.

Key features of CY7C2663KV18-450BZI

The CY7C2663KV18-450BZI leverages advanced architecture to address the demanding requirements of high-performance volatile memory applications. Its four-word burst capability, combined with a 2.5-cycle read latency, forms the core for high-throughput memory subsystems in systems requiring low bus arbitration and minimized transaction gaps. By enabling rapid, sequential multi-word transfers with a single command, this burst mode efficiently utilizes bus bandwidth and simplifies timing control, directly impacting the throughput of cache interfaces and communication buffers where deterministic operation is non-negotiable.

At the signaling layer, the device’s DDR interface on both read and write ports significantly elevates data throughput. Operating on both rising and falling edges of the clock, the memory achieves up to 1100 MT/s at the highest speed grades, with the -450BZI variant supporting stable operation up to 450 MHz. This interface allows for tight timing margins and direct compatibility with modern FPGAs or ASICs, reducing interface adaptation work in high-bandwidth data paths. Independent, physically separate data buses for read and write further allow overlapping accesses, supporting true simultaneous bidirectional transactions critical in multi-threaded data processing pipelines and real-time packet processing engines.

Fine-grained control is realized through Byte Write Select (BWS) signals, whose presence enables partial writes at byte resolution. These signals underpin the implementation of efficient read-modify-write operations that are necessary in embedded systems handling variable-length data structures, such as network descriptors or protocol state machines. By leveraging granularity at the byte level, system designers can optimize memory accesses without the need for full-word masking in external logic, conserving bus bandwidth and reducing latency in pipelined operations.

Signal integrity, a recurring bottleneck at high frequencies, is directly addressed through integrated On-Die Termination (ODT) for data, control, and strobe lines. By embedding ODT, the memory device mitigates transmission line reflections, allowing for stable high-speed signaling even on dense multi-drop buses. This integration eases PCB routing constraints and reduces the need for discrete termination resistors, especially valuable in high-density designs where board real estate and signal clarity are paramount.

Further refinement is available through a programmable impedance control mechanism. Using an external precision RQ resistor, the output driver impedance can be dynamically tuned to match the PCB environment. This alignment minimizes mismatch-induced reflections and opens the design space for innovative board layouts in restricted envelopes, for instance, in compact industrial controllers or advanced medical devices.

From a system-level integration perspective, the device’s industrial temperature range (-40°C to +85°C) and compact 165-ball FBGA package (15 × 17 mm) facilitate deployment in environments where both thermal robustness and board space efficiency are required. These attributes are directly applicable to advanced instrumentation, aerospace, and hardened field equipment, where memory subsystems must combine performance and survivability.

Practical integration of such SRAM devices highlights nuanced issues: clock skew management becomes pivotal at frequencies exceeding 400 MHz, making careful trace matching and real-time calibration beneficial. Byte-write operations, though powerful, necessitate precise control logic to avoid inadvertent data overwrite—especially in concurrent-access multi-master topologies. The cumulative effect of embedded termination and programmable impedance provides latitude during board bring-up, often reducing the iteration cycles needed in pre-silicon validation and laboratory signal quality tuning.

The CY7C2663KV18-450BZI exemplifies the trend toward consolidating signal, power, and protocol management within memory devices themselves, a move that shifts complexity away from PCB design and into silicon for higher reliability and repeatability. This approach not only streamlines system design but establishes a foundation for accelerated development cycles in performance-critical, space-constrained applications.

Functional description and operating principles of CY7C2663KV18-450BZI

The CY7C2663KV18-450BZI encapsulates an advanced QDR II+ SRAM architecture, distinctly structured as four independent 2M × 18-bit memory banks accessed via a 21-bit multiplexed address bus. All data transfers are both edge-triggered and fully synchronous to a pair of system clocks, K and K, enabling deterministic and low-jitter data movement. This dual-edge clocking mechanism forms the basis of its quad data rate functionality: by sampling signals on both rising edges, the device sharply increases throughput without raising the base clock frequency. Such architecture supports scalable line speeds and addresses the critical timing margins required in high-performance network switching or caching subsystems.

Read and write transactions are tightly orchestrated by RPS (Read Port Select) and WPS (Write Port Select) inputs. Asserted RPS latches the given address and schedules a burst read pipeline; after a fixed 2.5-cycle latency, the SRAM presents a four-word burst on the data bus. Write sequences mirror this pipelined organization—WPS assertion captures both the address and up to four sequential data words within two cycles. This symmetry between read and write access pipelining supports predictable memory timing, essential for mapping memory cycles to bus-level transactions in complex SoCs or network routers.

To maintain bus discipline and avoid port contention, the memory enforces a strict prohibition on immediate back-to-back accesses on the same port. This constraint is intrinsic to the device’s internal pipeline management, preventing data hazards and maximizing the utilization of available cycles across the four independent memory banks. Such a feature is directly leveraged in practical applications such as multi-queue network buffers, where interleaved accesses enhance effective bandwidth utilization.

The device’s arbitration engine resolves overlapping read-after-write sequences to the same address by forwarding the most up-to-date data into the read pipeline, thereby preserving data coherency at the memory interface. This low-level coherency guarantee simplifies upper-level system design—when used in high-speed cache or FIFO implementations, latency-sensitive traffic need not be burdened with manual data hazard resolution logic. The implicit design philosophy here prioritizes the anticipation of race conditions and resolves them at the silicon level, reducing the controller logic complexity.

For integration into high-frequency data paths, the CY7C2663KV18-450BZI supplies dedicated echo clocks (CQ, CQ) aligned with data outputs. These clocks enable receivers to sample outbound data with minimal skew, unwinding the signal integrity challenges that typically plague parallel interfaces operating above 400 MHz. The QVLD (data valid) signal is precisely aligned to these clocks, further reinforcing deterministic timing for asynchronous or cross-domain controllers. Experience shows that adopting the device’s echo clocking and QVLD indications can substantially reduce the timing closure effort compared to generic memory modules, especially under aggressive timing constraints.

Such a combination of deterministic pipeline scheduling, coherency management, and interface signaling forms a robust platform for memory-intensive designs. The CY7C2663KV18-450BZI’s operational model, when mapped to time-critical applications like packet buffers or embedded cache, supports both throughput scaling and system-level timing closure without demanding excessive controller sophistication. This trait positions the device as a primary memory building block within multi-core switch fabrics, real-time data aggregators, and other bandwidth-sensitive digital systems.

Detailed electrical and timing characteristics of CY7C2663KV18-450BZI

The CY7C2663KV18-450BZI leverages advanced process integration to optimize electrical and timing parameters for high-performance memory applications. Operating at a core voltage range from 1.7 V to 1.9 V, with flexible I/O compatibility down to 1.5 V, it achieves a balance between power conservation and mobility for rapid, low-latency data transactions. Supply voltage flexibility enables streamlined interoperability with heterogeneous system architectures, where optimizing for both energy footprint and signal reliability is often a critical design constraint.

At its maximum 450 MHz frequency, the device sustains high-bandwidth throughput without degrading signal fidelity. Central to this capability is the integrated Phase-Locked Loop (PLL), which maintains precise clock alignment across synchronous interfaces. The PLL’s reconfigurability—switching via the DOFF pin—accommodates both modern QDR II+ deployments and legacy QDR I requirements, preserving system adaptability and simplifying migration strategies. This dual-mode operation allows for seamless integration in environments where both backward compatibility and future-proof speed are necessary.

Attention to board-level signal management emerges in the implementation of On-Die Termination (ODT) and programmable impedance. These features mitigate reflection and crosstalk, which are prominent at elevated operational frequencies. Practical experience shows that proper impedance calibration significantly reduces electromagnetic interference (EMI) and ensures consistent data eye patterns, facilitating reliable data transfers in densely populated PCBs and complex interconnect layouts. The integrated termination further decreases reliance on external components, which simplifies layout and reduces signal path distortions.

Timing margin and skew characteristics are published in detail, supporting rigorous timing closure procedures in memory subsystem design. Synchronous activity, referenced consistently to the K and K’ clock pairs, enables precise multi-bank operation while affording designers a deterministic timing framework. Effective use of these timing parameters, especially when measuring inter-bank and intra-bank skew, is vital during board bring-up and validation phases. Experience indicates that exploiting the documented skew limits allows tighter clock domain synchronization, maximizing throughput without violating setup and hold constraints.

The CY7C2663KV18-450BZI’s architectural choices reflect an underlying emphasis on scalability and reliability. Its electrical and timing detail provides an engineered pathway for deploying robust, high-speed memory in server and network infrastructure contexts where both endurance and adaptability are paramount. Strategic exploitation of features such as dynamic PLL control and programmable impedance positions the device as not merely a high-speed memory, but as an enabler for scalable, future-ready platforms. This layered complexity, when harnessed effectively, consistently yields robust operation and enables innovative memory subsystem designs.

Pin configuration, signal functions, and interface specifics for CY7C2663KV18-450BZI

Pin configuration, signaling, and interface implementation on the CY7C2663KV18-450BZI are optimized for high-performance synchronous SRAM deployment in advanced computing subsystems. The device is encapsulated in a 165-ball FBGA package, facilitating dense pin mapping and reliable signal integrity across complex PCB layouts. The package layout maximizes routing efficiency while minimizing parasitic effects, supporting the physical rigor of high-speed memory channels.

Signal allocation is sharply defined to ensure deterministic access cycles. Data inputs D[17:0] operate as an 18-bit parallel bus, capturing write data synchronously on both rising edges of K and K clocks—a mechanism underpinning double data rate (DDR) semantics. This edge-sensitive sampling reduces latency and doubles effective bandwidth without increasing internal clock frequency. Output data Q[17:0] follows a four-word burst scheme, aligning with efficient transfer protocols found in cache and buffer architectures. The burst configuration enables streamlined prefetch logic, reducing command overhead and aligning with typical read-modify-write patterns in processor-memory communications.

Clocking architecture is engineered for stringent timing margins. Dual differential clock inputs, K and K, synchronize all read/write transactions. The interface leverages echo clocks CQ and CQ, which mirror Q[17:0] transitions and support timing calibration at the controller end. This arrangement simplifies timing closure in multi-board systems, allowing robust setup and hold analysis. The separation of CQ/CQ from the primary clocks isolates data path jitter and offers a reference for signal alignment during PCB characterization.

Port management utilizes RPS and WPS pins for independent selection of read and write access, providing flexible bank-level arbitration—a feature critical for concurrent operations in multiport memory controller designs. BWS[1:0] delivers granular byte write enables, permitting selective mask operations and reducing unnecessary bus activity. This fine control aligns with embedded system requirements where byte-level modifications are frequent.

QVLD pin serves as a direct indicator of valid data presence on Q[17:0]. System controller logic leverages QVLD for dynamic strobe generation, optimizing read pipeline throughput and ensuring error-free data capture during burst sequences.

Impedance control and signal termination are distinctly provisioned. ZQ connects to an external RQ resistor, enabling output driver calibration and maintaining signal integrity across varying PCB loads. This real-time adjustment method counters impedance mismatch and preserves eye diagram quality during exhaustive signal validation. ODT pin manages integrated termination for key inputs, reducing reflection and crosstalk, especially beneficial in high-density channel scenarios where aggregated noise can degrade margin.

Device supports industry-standard voltage rails and incorporates JTAG boundary scan, streamlining device installation, testing, and live fault diagnosis. Boundary scan integration accelerates board bring-up and enhances system-level maintenance procedures, providing granular access for debugging without intrusive hardware probes.

In practical deployment, attention to signal integrity—particularly around differential clock lines and impedance-referenced outputs—yields superior timing performance and minimizes bit error rates. Optimized routing for CQ/Q paths guards against timing skew, and calibration routines using ZQ enhance compatibility with varied controller platforms. The combination of burst read/write, byte-level control, and robust timing signals positions the CY7C2663KV18-450BZI as an adaptable memory solution, consistently delivering low-latency, reliable operation in data-centric architectures.

It emerges that effective exploitation of the device’s interface flexibility enables the architecting of scalable, high-bandwidth memory solutions, while careful engineering of pin configuration and signal calibration unlocks performance gains that are not attainable through basic SRAM modules. The convergence of synchronized sampling, echo clocking, and programmable termination defines the competitive edge of this SRAM generation, projecting its utility across a broad spectrum of embedded and network processing platforms.

Application considerations and depth expansion using CY7C2663KV18-450BZI

The CY7C2663KV18-450BZI’s dual-port synchronous SRAM architecture provides a deterministic approach to high-frequency data handling in scenarios where bandwidth and concurrency are non-negotiable. Its asynchronous and independent read/write ports offer full-duplex access, minimizing wait states and substantially increasing throughput for multi-threaded processing environments. In large-scale routers, for instance, this feature directly addresses contention and pipeline stalls, enabling sustained multi-gigabit data streams, especially where dynamic routing table updates and packet buffering overlap in real time.

Scalability is streamlined through its native port parallelization. Each port’s select inputs support stacking of multiple memory devices to expand addressable depth linearly, without introducing complex arbitration circuits or the latency of bus sharing. Data coherency logic within the device synchronizes overlapping accesses at the silicon level, so that systems maintain memory integrity during simultaneous updates—a critical attribute in clustered processors or time-sensitive data logging where cross-domain consistency cannot be compromised. This integration mitigates the risk of indeterminate states caused by access collisions, offering architects confidence when scaling for deeper queues or higher fan-in/fan-out requirements.

Signal integrity at elevated clock rates is proactively addressed by the device’s on-die termination (ODT) and programmable output driver impedance. In PCB-level implementations, designers no longer shoulder the full burden of fine-tuning series resistors or managing stub lengths to prevent reflections. Instead, the device’s impedance control adapts dynamically to line conditions, reducing board complexity and easing the path to compliance with demanding eye diagram and jitter budgets. As a result, rapid prototyping phases show improved signal fidelity with fewer board rescins, directly contributing to shortened validation cycles.

These features collectively generate an environment where high-throughput, low-latency communication subsystems can be realized with predictable timing closure and minimal glue logic. The layered hardware-level solutions encapsulated in the CY7C2663KV18-450BZI set a compelling reference for system designers—demonstrating that integrating robust memory handling closer to the data fabric, with built-in noise immunity and expansion paths, is essential for sustained performance under modern, distributed workloads. The device’s configuration flexibility subtly guides architects toward leaner, more deterministic memory subsystems, sidestepping historical bottlenecks of single-port architectures without sacrificing signal quality or scale.

Potential equivalent/replacement models for CY7C2663KV18-450BZI

A robust evaluation of equivalent or replacement models for the CY7C2663KV18-450BZI necessitates a rigorous examination of device-level parameters, interface architecture, and system integration constraints. At the foundational level, architecture compatibility must center on QDR II+ SRAM topology, as exhibited by the CY7C2663KV18, which delivers high-bandwidth, dual-port operations optimized for network processors and data caching environments. The CY7C2665KV18 emerges as a logical transition point within the Cypress/Infineon QDR II+ spectrum, with its expanded 4M × 36 configuration directly benefiting those designs that demand a broader data bus while preserving protocol and operational symmetry.

An exploration across other QDR II+ SRAM devices from established vendors reveals a tightly curated set of alternatives; frequency matching, organizational parity, and feature alignment should be tracked meticulously. The interface must be scrutinized for protocol compliance, particularly regarding clocking schemes, burst modes, and timing constraints. Packaging and signal pinout present an additional layer—not merely as physical connectivity concerns, but as determinants for layout reuse, soldering footprints, and board-level modifications. Timing compatibility, encompassing access latency, setup/hold cycles, and propagation delays, must be cross-referenced with application timing budgets to preclude negative performance impacts. Successful migrations often involve signal mapping exercises, with pin reassignments or bridging, followed by exhaustive bench-level validation.

Migrating to advanced QDR IV SRAMs or DDR-based alternatives introduces both throughput benefits and integration complexities. These newer variants offer higher frequencies and denser data paths, but their pinout restructuring and nuanced command protocols demand careful schematic adaptation. Practical experience reveals the necessity of simulation-driven verifications, where behavioral and timing models are iteratively tested against real-world workloads. In bandwidth-constrained environments, QDR IV’s improved burst performance can catalyze system-level optimization, provided controller update cycles and PCB impedance tuning are addressed concurrently.

Deep compatibility evaluation extends beyond datasheet comparisons. It involves aligning silicon-level electrical characteristics and investigating legacy support, especially where existing firmware or hardware IP blocks are embedded. Application scenarios span edge packet buffers, data analytics accelerators, and hardware cache layers, which frequently drive the selection process toward both performance and long-term supply stability. Ensuring uninterrupted sourcing, footprint consistency, and operational integrity often outstrips mere functional equivalency as a deciding factor in engineering calculations.

A nuanced insight is that the tradeoff between widespread supply continuity and optimal performance persists as a fundamental balancing act. When deploying equivalent models, systematic qualification cycles—encompassing prototyping, layout adjustments, and stage-gate reliability tests—should overlay the technical decision matrix. As engineering efforts progress, attention to incremental compatibility adaptation unlocks both immediate project viability and futureproofing within fast-evolving memory subsystems.

Conclusion

The CY7C2663KV18-450BZI leverages Infineon Technologies’ refined QDR II+ SRAM architecture to deliver highly efficient memory access for systems facing intensive throughput demands. The dual-port, concurrent access structure underpins independent read and write operations, maximizing data pipeline efficiency and minimizing bottlenecks. This design taps into advanced temporal coordination, with programmable timing controls that allow precise synchronization with external devices—essential for concerted operation within high-frequency networking hardware or complex embedded controllers.

By integrating byte-select capability and scalable parallel interface options, the device offers significant flexibility for fine-grained data manipulation and bandwidth aggregation. This adaptability extends naturally to multi-channel applications, such as network packet buffering, telecom switch fabric, and real-time signal processing, where simultaneous multi-user access and deterministic latency are critical.

Impedance matching and signal integrity features are engineered directly into the package for optimal transmission at elevated clock speeds, addressing common pitfalls in high-speed PCB design. These provisions support broad deployment in scenarios ranging from backbone routers to edge inferencing platforms, mitigating cross-talk and ensuring robust data consistency across environments with tight timing budgets.

Teams familiar with practical implementation recognize the advantages of integrating QDR II+ SRAMs like the CY7C2663KV18-450BZI early in the design cycle. Its forward-compatible interface and high endurance enable iterative platform upgrades without deep architectural overhauls. Projects scaling from gigabit-class to terabit-class traffic benefit from its native support for high-depth buffering and rapid access, streamlining migration and maintenance strategies.

Within today’s rapidly evolving network infrastructures, selecting a memory solution that combines speed, concurrency, and manageability is paramount. The CY7C2663KV18-450BZI encapsulates these priorities not just as an individual product but as an exemplar of modular, scalable, and application-centric engineering. By examining memory subsystems as strategic enablers rather than mere components, designs unlock sharper performance envelopes and resilient longevity across generations.

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Catalog

1. Product overview: CY7C2663KV18-450BZI and QDR II+ architecture2. Key features of CY7C2663KV18-450BZI3. Functional description and operating principles of CY7C2663KV18-450BZI4. Detailed electrical and timing characteristics of CY7C2663KV18-450BZI5. Pin configuration, signal functions, and interface specifics for CY7C2663KV18-450BZI6. Application considerations and depth expansion using CY7C2663KV18-450BZI7. Potential equivalent/replacement models for CY7C2663KV18-450BZI8. Conclusion

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Frequently Asked Questions (FAQ)

What is the main function of the CY7C2663KV18-450BZI memory IC?

The CY7C2663KV18-450BZI is a synchronous SRAM (Static Random-Access Memory) designed for high-speed data storage and access, supporting applications that require fast memory performance at up to 450 MHz.

Is this SRAM memory suitable for high-temperature environments?

Yes, this memory operates reliably within a temperature range of -40°C to 85°C, making it suitable for industrial and automotive applications with high-temperature requirements.

What are the compatibility and interface specifications of this QDR II+ SRAM IC?

This SRAM uses a parallel memory interface and is organized as 8M x 18, compatible with systems that support parallel data transfer at 165-FBGA packages, ensuring easy integration into high-speed electronic designs.

Does this memory IC require a specific voltage supply?

Yes, it operates within a supply voltage range of 1.7V to 1.9V, which helps reduce power consumption and supports energy-efficient applications.

What are the key benefits of choosing this infineon SRAM chip for my project?

This IC provides high-speed performance at 450 MHz, a compact 165-FBGA package, and reliable operation across a wide temperature range, making it ideal for demanding advanced electronics.

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